Jochen De Weerdt, Manu De Backer, Jan Vanthienen, Bart Baesens. A robust F-measure for evaluating discovered process models. In Proceedings of the IEEE Symposium on Computational Intelligence and Data Mining, CIDM 2011, part of the IEEE Symposium Series on Computational Intelligence 2011, April 11-15, 2011, Paris, France. pages 148-155, IEEE, 2011. [doi]
Abstract is missing.