Carsten Wegener, Michael Peter Kennedy. Innovation to overcome limitations of test equipment. In Proceedings of the 2005 European Conference on Circuit Theory and Design, ECCTD 2005, Cork Ireland, August 29th - September 1st 2005. pages 309-314, IEEE, 2005. [doi]
@inproceedings{WegenerK05-0, title = {Innovation to overcome limitations of test equipment}, author = {Carsten Wegener and Michael Peter Kennedy}, year = {2005}, doi = {10.1109/ECCTD.2005.1522972}, url = {https://doi.org/10.1109/ECCTD.2005.1522972}, researchr = {https://researchr.org/publication/WegenerK05-0}, cites = {0}, citedby = {0}, pages = {309-314}, booktitle = {Proceedings of the 2005 European Conference on Circuit Theory and Design, ECCTD 2005, Cork Ireland, August 29th - September 1st 2005}, publisher = {IEEE}, isbn = {0-7803-9066-0}, }