Carsten Wegener, Michael Peter Kennedy, Bernd Straube. Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electronic Testing, 17(5):409-416, 2001. [doi]
@article{WegenerKS01,
title = {Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits},
author = {Carsten Wegener and Michael Peter Kennedy and Bernd Straube},
year = {2001},
doi = {10.1023/A:1012703202816},
url = {http://dx.doi.org/10.1023/A:1012703202816},
tags = {testing},
researchr = {https://researchr.org/publication/WegenerKS01},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {5},
pages = {409-416},
}