Sleuth: A Switchable Dual-Mode Fuzzer to Investigate Bug Impacts Following a Single PoC

Haolai Wei, Liwei Chen, Zhijie Zhang, Gang Shi, Dan Meng. Sleuth: A Switchable Dual-Mode Fuzzer to Investigate Bug Impacts Following a Single PoC. In Maria Christakis, Michael Pradel, editors, Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2024, Vienna, Austria, September 16-20, 2024. pages 730-742, ACM, 2024. [doi]

Abstract

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