Guobin Wei, Yuta Goto, Akio Ohta, Katsunori Makihara, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. Impact of Annealing Ambience on Resistive Switching in Pt/TiO::2::/Pt Structure. IEICE Transactions, 94-C(5):699-704, 2011. [doi]
@article{WeiGOMMHM11,
title = {Impact of Annealing Ambience on Resistive Switching in Pt/TiO::2::/Pt Structure},
author = {Guobin Wei and Yuta Goto and Akio Ohta and Katsunori Makihara and Hideki Murakami and Seiichiro Higashi and Seiichi Miyazaki},
year = {2011},
url = {http://search.ieice.org/bin/summary.php?id=e94-c_5_699},
researchr = {https://researchr.org/publication/WeiGOMMHM11},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {94-C},
number = {5},
pages = {699-704},
}