Guo-Feng Wei, M. Ronnier Luo, Peter A. Rhodes. Can You See What Others See -A Defect Detection Model for Patterned Backgrounds. In 6th European Conference on Colour in Graphics, Imaging, and Vision, CGIV 2012, Amsterdam, the Netherlands, May 6-9, 2012. pages 108-114, IS&T - The Society for Imaging Science and Technology, 2012. [doi]
Abstract is missing.