Jyh-Da Wei, Yu-Ju Lin, Yi-Jing Wu, Li-Wei Kang. A patch analysis approach for seam-carved image detection. In Special Interest Group on Computer Graphics and Interactive Techniques Conference, SIGGRAPH '13, Anaheim, CA, USA, July 21-25, 2013, Poster Proceedings. pages 54, ACM, 2013. [doi]
Abstract is missing.