Malicious circuitry detection using fast timing characterization via test points - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sheng Wei, Miodrag Potkonjak. Malicious circuitry detection using fast timing characterization via test points. In 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2013, Austin, TX, USA, June 2-3, 2013. pages 113-118, IEEE, 2013. [doi]

This author has not been identified. Look up 'Sheng Wei' in GoogleThis author has not been identified. Look up 'Miodrag Potkonjak' in Google

runs on WebDSL