Jing Wei, Fei Shen, Chengkan Lv, Zhengtao Zhang, Feng Zhang, Huabin Yang. Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 4445-4453, IEEE, 2023. [doi]
Abstract is missing.