Deep-BIF: Blind Image Forensics Based on Deep Learning

Baole Wei, Min Yu, Kai Chen, Jianguo Jiang. Deep-BIF: Blind Image Forensics Based on Deep Learning. In 2019 IEEE Conference on Dependable and Secure Computing, DSC 2019, Hangzhou, China, November 18-20, 2019. pages 1-6, IEEE, 2019. [doi]

Authors

Baole Wei

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Min Yu

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Kai Chen

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Jianguo Jiang

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