Baole Wei, Min Yu, Kai Chen, Jianguo Jiang. Deep-BIF: Blind Image Forensics Based on Deep Learning. In 2019 IEEE Conference on Dependable and Secure Computing, DSC 2019, Hangzhou, China, November 18-20, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{WeiYCJ19,
title = {Deep-BIF: Blind Image Forensics Based on Deep Learning},
author = {Baole Wei and Min Yu and Kai Chen and Jianguo Jiang},
year = {2019},
doi = {10.1109/DSC47296.2019.8937712},
url = {https://doi.org/10.1109/DSC47296.2019.8937712},
researchr = {https://researchr.org/publication/WeiYCJ19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2019 IEEE Conference on Dependable and Secure Computing, DSC 2019, Hangzhou, China, November 18-20, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2319-6},
}