Improved label noise identification by exploiting unlabeled data

Hongqiang Wei, Qi Zhu, Donghai Guan, Weiwei Yuan, Asad Masood Khattak, Francis Chow. Improved label noise identification by exploiting unlabeled data. In International Conference on Security, Pattern Analysis, and Cybernetics, SPAC 2017, Shenzhen, China, December 15-17, 2017. pages 284-289, IEEE, 2017. [doi]

Abstract

Abstract is missing.