Bruce W. Weide, Stephen H. Edwards, Wayne D. Heym, Timothy J. Long, William F. Ogden. Characterizing observability and controllability of software components. In Murali Sitaraman, editor, Proceedings of Fourth IEEE International Conference on Software Reuse, ICSR 1996, April 23-26, 1996, Orlando, Florida, USA. pages 62-71, IEEE, 1996. [doi]
Abstract is missing.