Daphna Weinshall, Ronen Basri. Distance metric between 3D models and 2D images for recognition and classification. In Conference on Computer Vision and Pattern Recognition, CVPR 1993, 15-17 June, 1993, New York, NY, USA. pages 220-225, IEEE, 1993. [doi]
@inproceedings{WeinshallB93,
title = {Distance metric between 3D models and 2D images for recognition and classification},
author = {Daphna Weinshall and Ronen Basri},
year = {1993},
doi = {10.1109/CVPR.1993.340986},
url = {http://dx.doi.org/10.1109/CVPR.1993.340986},
researchr = {https://researchr.org/publication/WeinshallB93},
cites = {0},
citedby = {0},
pages = {220-225},
booktitle = {Conference on Computer Vision and Pattern Recognition, CVPR 1993, 15-17 June, 1993, New York, NY, USA},
publisher = {IEEE},
isbn = {0-8186-3880-X},
}