Distance metric between 3D models and 2D images for recognition and classification

Daphna Weinshall, Ronen Basri. Distance metric between 3D models and 2D images for recognition and classification. In Conference on Computer Vision and Pattern Recognition, CVPR 1993, 15-17 June, 1993, New York, NY, USA. pages 220-225, IEEE, 1993. [doi]

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