Bonnie E. Weir, Vani Prasad, Shahriar Moinian, SangJune Park, Joseph Blasko, Jason Brown, Jayanthi Pallinti. Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{WeirPMPBBP19,
title = {Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits},
author = {Bonnie E. Weir and Vani Prasad and Shahriar Moinian and SangJune Park and Joseph Blasko and Jason Brown and Jayanthi Pallinti},
year = {2019},
doi = {10.1109/IRPS.2019.8720475},
url = {https://doi.org/10.1109/IRPS.2019.8720475},
researchr = {https://researchr.org/publication/WeirPMPBBP19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}