Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer. Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 189-192, IEEE, 2012. [doi]
@inproceedings{WeisFSSMZ12,
title = {Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz},
author = {Mario Weis and Sébastien Fregonese and Marco Santorelli and Amit Kumar Sahoo and Cristell Maneux and Thomas Zimmer},
year = {2012},
doi = {10.1109/ESSDERC.2012.6343365},
url = {http://dx.doi.org/10.1109/ESSDERC.2012.6343365},
researchr = {https://researchr.org/publication/WeisFSSMZ12},
cites = {0},
citedby = {0},
pages = {189-192},
booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1707-8},
}