Qualification of 50 V GaN on SiC technology for RF power amplifiers

P. J. van der Wel, T. Rödle, B. Lambert, H. Blanck, M. Dammann. Qualification of 50 V GaN on SiC technology for RF power amplifiers. Microelectronics Reliability, 53(9-11):1439-1443, 2013. [doi]

Authors

P. J. van der Wel

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T. Rödle

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B. Lambert

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H. Blanck

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M. Dammann

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