Yintang Wen, Jiaxing Cheng, Yaxue Ren, Yankai Feng, Zhiwei Zhang, Yuyan Zhang. Complex Defects Detection of 3-D-Printed Lattice Structures: Accuracy and Scale Improvement in YOLO V7. IEEE T. Instrumentation and Measurement, 73:1-9, 2024. [doi]
Abstract is missing.