Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita. A Per-Test Fault Diagnosis Method Based on the ::::X::::-Fault Model. IEICE Transactions, 89-D(11):2756-2765, 2006. [doi]
Abstract is missing.