Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis

Yihan Wen, Juan Li, Xiaoyi Wang. Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis. In IEEE/ACM International Conference on Computer Aided Design, ICCAD 2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023. pages 1-8, IEEE, 2023. [doi]

Authors

Yihan Wen

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Juan Li

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Xiaoyi Wang

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