Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang. A novel scheme to reduce power supply noise for high-quality at-speed scan testing. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
@inproceedings{WenMKSYGOW07,
title = {A novel scheme to reduce power supply noise for high-quality at-speed scan testing},
author = {Xiaoqing Wen and Kohei Miyase and Seiji Kajihara and Tatsuya Suzuki and Yuta Yamato and Patrick Girard and Yuji Ohsumi and Laung-Terng Wang},
year = {2007},
doi = {10.1109/TEST.2007.4437632},
url = {http://dx.doi.org/10.1109/TEST.2007.4437632},
researchr = {https://researchr.org/publication/WenMKSYGOW07},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}