Efficient Test Set Modification for Capture Power Reduction

Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja. Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics, 1(3):319-330, 2005. [doi]

Abstract

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