Shengping Wen, Yiwen Tao, Jingfu Chen. Defect Detection for Mobile Phone Cases Based on Improved Yolo Model. In ICCAI '21: 2021 7th International Conference on Computing and Artificial Intelligence, Tianjin China, April 23 - 26, 2021. pages 28-38, ACM, 2021. [doi]
Abstract is missing.