Effective Isolation of Fault-Correlated Variables via Statistical and Mutation Analysis

Ming Wen 0001, Zifan Xie, Kaixuan Luo, Xiao Chen, Yibiao Yang, Hai Jin 0001. Effective Isolation of Fault-Correlated Variables via Statistical and Mutation Analysis. IEEE Trans. Software Eng., 49(4):2053-2068, April 2023. [doi]

Abstract

Abstract is missing.