A New Method for Low-Capture-Power Test Generation for Scan Testing

Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita. A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Transactions, 89-D(5):1679-1686, 2006. [doi]

Abstract

Abstract is missing.