Rui-Cian Weng, Shih-Jye Chou, Yen-Pei Lu. Design and Implementation of Illumination Control of High Speed Chip-Back Defects Inspection System. In IEEE 8th Global Conference on Consumer Electronics, GCCE 2019, Osaka, Japan, October 15-18, 2019. pages 233-235, IEEE, 2019. [doi]
Abstract is missing.