Detection of Recycled ICs Using Backscattering Side-Channel Analysis

Frank T. Werner, Milos Prvulovic, Alenka G. Zajic. Detection of Recycled ICs Using Backscattering Side-Channel Analysis. IEEE Trans. VLSI Syst., 30(9):1244-1255, 2022. [doi]

@article{WernerPZ22,
  title = {Detection of Recycled ICs Using Backscattering Side-Channel Analysis},
  author = {Frank T. Werner and Milos Prvulovic and Alenka G. Zajic},
  year = {2022},
  doi = {10.1109/TVLSI.2022.3190236},
  url = {https://doi.org/10.1109/TVLSI.2022.3190236},
  researchr = {https://researchr.org/publication/WernerPZ22},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {30},
  number = {9},
  pages = {1244-1255},
}