Reliable ultra-low-voltage low-power probabilistic-based noise-tolerant latch design

I.-Chyn Wey, Yi-Jung Lan, Chien-Chang Peng. Reliable ultra-low-voltage low-power probabilistic-based noise-tolerant latch design. Microelectronics Reliability, 53(12):2057-2069, 2013. [doi]

Abstract

Abstract is missing.