Reliability enhancement of CMOS SRAMs - researchr publication authors

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Chin-Long Wey, Meng-Yao Liu, Shaolei Quan. Reliability enhancement of CMOS SRAMs. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 146-151, IEEE Computer Society, 2005. [doi]

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