Kim Weyns, Martin Höst. Risk analysis for critical systems with reliability block diagrams. In Léon J. M. Rothkrantz, Jozef Ristvej, Zeno Franco, editors, 9th Proceedings of the International Conference on Information Systems for Crisis Response and Management, Vancouver, Canada, April 22-25, 2012. Simon Fraser University, Vancouver, Canada, 2012. [doi]
Abstract is missing.