Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix. ASIC Test Cost/Strategy Trade-offs. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 93-102, IEEE Computer Society, 1994.
@inproceedings{WheaterNML94,
title = {ASIC Test Cost/Strategy Trade-offs},
author = {Donald L. Wheater and Phil Nigh and Jeanne Trinko Mechler and Luke Lacroix},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/WheaterNML94},
cites = {0},
citedby = {0},
pages = {93-102},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}