Donald L. Wheater - researchr alias

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Viewing Publication 1 - 13 from 13

2003

An On-Chip Self-Repair Calculation and Fusing MethodologyDarren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater. dt, 20(5):67-75, 2003. [doi]

ATE-Customer Perspectives & Requirements PanelDonald L. Wheater. itc 2003: 1298 [doi]

2002

2001

Test Trade-Offs Take Center Stage at ITCTony Ambler, Donald L. Wheater. dt, 18(5):59, 2001.

A SmartBIST Variant with Guaranteed EncodingBernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater. ats 2001: 325 [doi]

1997

Will 0.1um Digital Circuits Require Mixed-Signal TestingMelvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater. vts 1997: 186-187 [doi]

1994

ASIC Test Cost/Strategy Trade-offsDonald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix. itc 1994: 93-102

1990

Low-Cost Testing of High-Density Logic ComponentsRobert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. dt, 7(2):15-28, 1990. [doi]

1989

Low Cost Testing of High Density Logic ComponentsRobert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. itc 1989: 550-557

1984

IBM s Cost Performance Array Tester Architecture for the 80 sDonald L. Wheater. itc 1984: 466-470

1981

The Series/1 as a Test System Controller for System Verification and CalibrationDonald L. Wheater, Richard Soderman. itc 1981: 377-380

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