Melvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater. Will 0.1um Digital Circuits Require Mixed-Signal Testing. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 186-187, IEEE Computer Society, 1997. [doi]
Abstract is missing.