Melvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater. Will 0.1um Digital Circuits Require Mixed-Signal Testing. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 186-187, IEEE Computer Society, 1997. [doi]
@inproceedings{BreuerKMRW97,
title = {Will 0.1um Digital Circuits Require Mixed-Signal Testing},
author = {Melvin A. Breuer and Bozena Kaminska and J. McDermid and V. Rayapathi and Donald L. Wheater},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100186.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/BreuerKMRW97},
cites = {0},
citedby = {0},
pages = {186-187},
booktitle = {15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA},
publisher = {IEEE Computer Society},
}