Carl Barnhart - researchr alias

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Viewing Publication 1 - 8 from 8

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts. date 2004: 1184-1191 [doi]

2003

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital NetworksBill Eklow, Carl Barnhart, Kenneth P. Parker. dt, 20(5):76-83, 2003. [doi]

IEEE 1149.6 - A Practical PerspectiveBill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz. itc 2003: 494-502 [doi]

2002

Extending OPMISR beyond 10x Scan Test EfficiencyCarl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera. dt, 19(5):65-72, 2002. [doi]

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital NetworksBill Eklow, Carl Barnhart, Kenneth P. Parker. itc 2002: 1056-1065 [doi]

2001

OPMISR: the foundation for compressed ATPG vectorsCarl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko. itc 2001: 748-757

A SmartBIST Variant with Guaranteed EncodingBernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater. ats 2001: 325 [doi]

2000

Integrating Logic BIST in VLSI Designs with Embedded MemoriesVivek Chickermane, Scott Richter, Carl Barnhart. vts 2000: 157-164 [doi]

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