Ben Bennetts - researchr alias

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Viewing Publication 1 - 16 from 16

2007

Electronics Design-for-Test: Past, Present and FutureBen Bennetts. emnets 2007: 4 [doi]

2006

New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG)Bill Eklow, Ben Bennetts. emnets 2006: 253-254 [doi]

IEEE P1687: Toward Standardized Access of Embedded InstrumentationKen Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote. itc 2006: 1-8 [doi]

2005

IJTAG (internal JTAG): a step toward a DFT standardJeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts. itc 2005: 8 [doi]

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts. date 2004: 1184-1191 [doi]

2003

Guest Editors Introduction: Board TestMonica Lobetti Bodoni, Ben Bennetts. dt, 20(2):5-7, 2003. [doi]

Minimizing Pattern Count for Interconnect Test under a Ground Bounce ConstraintErik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts. dt, 20(2):8-18, 2003. [doi]

1999

Guest Editors Introduction: Test and the Product Life CycleTony Ambler, Ben Bennetts. dt, 16(3):20-22, 1999.

Boundary Scan: The Internet of TestMike Wondolowski, Ben Bennetts, Adam W. Ley. dt, 16(3):34-43, 1999. [doi]

1996

Built-In Self-Test: Assuring System IntegrityBernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie. Computer, 29(11):39-45, 1996.

1995

Guest Editor s IntroductionBen Bennetts. dt, 12(2):6-7, 1995.

1993

Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282Ben Bennetts. mam, 17(5):304, 1993. [doi]

1992

Progress in DFT: A Personal ViewBen Bennetts. itc 1992: 19-20

Macro Testability: The Results of Production Device ApplicationsFrank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker. itc 1992: 232-241

1990

Test Technology in EuropeBen Bennetts. dt, 7(1):6-8, 1990.

1971

Fault Diagnosis of Digital Systems - A ReviewBen Bennetts, D. W. Lewin. cj, 14(2):199-206, 1971.

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