Mike Ricchetti - researchr alias

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Viewing Publication 1 - 12 from 12

2016

Special panel session IIB: "System validation and silicon debug - Is standardization possible?"Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar. vts 2016: 1 [doi]

2015

Innovative practices session 3C: Advances in silicon debug & diagnosisMike Ricchetti. vts 2015: 1 [doi]

2013

Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICsArie Margulis, David Akselrod, Eric Rentschler, Mike Ricchetti. dt, 30(4):16-25, 2013. [doi]

2006

IEEE P1687: Toward Standardized Access of Embedded InstrumentationKen Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote. itc 2006: 1-8 [doi]

2004

A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and SystemsC. J. Clark, Mike Ricchetti. itc 2003: 857-866 [doi]

2003

Infrastructure IP for Configuration and Test of Boards and SystemsC. J. Clark, Mike Ricchetti. dt, 20(3):78-87, 2003. [doi]

IEEE 1149.6 - A Practical PerspectiveBill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz. itc 2003: 494-502 [doi]

2002

On IEEE P1500 s Standard for Embedded Core TestErik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian. et, 18(4-5):365-383, 2002. [doi]

Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark. vts 2002: 445-446 [doi]

2001

IP and Automation to Support IEEE P1500Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti. vts 2001: 411-412 [doi]

1998

Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standardBulent I. Dervisoglu, Mike Ricchetti, William Eklow. itc 1998: 980 [doi]

1988

Scan Diagnostic Strategy for the Series 10000 Prism WorkstationMike Ricchetti, John Hoglund. itc 1988: 987-992

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