Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote. IEEE P1687: Toward Standardized Access of Embedded Instrumentation. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
Abstract is missing.