Al Crouch - researchr alias

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Viewing Publication 1 - 16 from 16

2017

2016

Using Existing Reconfigurable Logic in 3D Die Stacks for TestFanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter. natw 2016: 46-52 [doi]

2015

A call to action: Securing IEEE 1687 and the need for an IEEE test Security StandardJennifer Dworak, Al Crouch. vts 2015: 1-4 [doi]

2014

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 networkAdam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter. date 2014: 1-6 [doi]

2013

Don't forget to lock your SIB: Hiding instruments using P16871Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton. itc 2013: 1-10 [doi]

2009

We need more standards like IEEE 1500Miron Abramovici, Al Crouch. dt, 26(1):104, 2009. [doi]

IEEE P1687 IJTAG a presentation of current technologyKen Posse, Al Crouch, Jeff Rearick. itc 2009: 1 [doi]

2006

IEEE P1687: Toward Standardized Access of Embedded InstrumentationKen Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote. itc 2006: 1-8 [doi]

2005

IJTAG (internal JTAG): a step toward a DFT standardJeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts. itc 2005: 8 [doi]

2001

Very Low Cost Testers: Opportunities and ChallengesJay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir. dt, 18(5):60-69, 2001. [doi]

1999

The DFT Psychic NetworkAl Crouch. dt, 16(1):96, 1999.

1998

Best Methods for At-Speed Testing?Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh. vts 1998: 460-461 [doi]

1997

Designing and Verifying Embedded MicroprocessorsAl Crouch, Jeff Freeman. dt, 14(4):87-94, 1997. [doi]

1995

The superscalar architecture of the MC68060Joe Circello, Greg Edgington, Dan McCarthy, James Gay, David Schimke, Steven Sullivan, Richard Duerden, Chris Hinds, Danny Marquette, Lal Sood, Al Crouch, Daniel Chow. micro, 15(2):10-21, 1995. [doi]

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