Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar. Special panel session IIB: "System validation and silicon debug - Is standardization possible?". In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1, IEEE Computer Society, 2016. [doi]
Abstract is missing.