Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker. Macro Testability: The Results of Production Device Applications. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 232-241, IEEE Computer Society, 1992.
Abstract is missing.