Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker. Macro Testability: The Results of Production Device Applications. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 232-241, IEEE Computer Society, 1992.
@inproceedings{BouwmanOSBB92,
title = {Macro Testability: The Results of Production Device Applications},
author = {Frank Bouwman and Steven Oostdijk and Rudi Stans and Ben Bennetts and Frans P. M. Beenker},
year = {1992},
tags = {testing, macros},
researchr = {https://researchr.org/publication/BouwmanOSBB92},
cites = {0},
citedby = {0},
pages = {232-241},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}