Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers, 7(2):15-28, 1990. [doi]
Abstract is missing.