Low-Cost Testing of High-Density Logic Components - researchr publication authors

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Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers, 7(2):15-28, 1990. [doi]

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