Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers, 7(2):15-28, 1990. [doi]
@article{BassettBDFGPPW90,
title = {Low-Cost Testing of High-Density Logic Components},
author = {Robert W. Bassett and Barry J. Butkus and Stephen L. Dingle and Marc R. Faucher and Pamela S. Gillis and Jeannie H. Panner and John G. Petrovick and Donald L. Wheater},
year = {1990},
doi = {10.1109/54.53042},
url = {http://doi.ieeecomputersociety.org/10.1109/54.53042},
tags = {testing, logic},
researchr = {https://researchr.org/publication/BassettBDFGPPW90},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {7},
number = {2},
pages = {15-28},
}