Lee Whetsel. Test Access of TAP ed & Non-TAP ed Cores. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 1041, IEEE Computer Society, 1997.
@inproceedings{Whetsel97a,
title = {Test Access of TAP ed & Non-TAP ed Cores},
author = {Lee Whetsel},
year = {1997},
tags = {testing},
researchr = {https://researchr.org/publication/Whetsel97a},
cites = {0},
citedby = {0},
pages = {1041},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}