Andrew Whetzel, Mircea R. Stan. Gate Overdrive with Split-Circuit Biasing to Substitute for Body Biasing in FinFET and UTB FDSOI Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 467-472, IEEE, 2016. [doi]
Abstract is missing.