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Critical analysis of encounter traces

John Whitbeck, Vania Conan, Marcelo Dias de Amorim. Critical analysis of encounter traces. In Nitin Vajdya, Emiliano Miluzzo, Nikodin Ristanovic, editors, Proceedings of the 2010 ACM workshop on Wireless of the students, by the students, for the students, S3@MOBICOM 2010, Chicago, IL, USA, September 20-24, 2010. pages 29-32, ACM, 2010. [doi]

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