Erratum to Determining factors affecting ESD failure voltage using DOE [Microelectron. Reliability 46 (2006) 1228-1237] - researchr publication

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Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell. Erratum to Determining factors affecting ESD failure voltage using DOE [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectronics Reliability, 46(12):2160, 2006. [doi]

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